Chip Classifier

GRADEX® CHIP CLASSIFIERS

 are the original fully automated chip classifier. It features PC-controls, automated test reporting and the ability to operate in the lab or in the wood yard. With a proven track record of trouble-free, reliable operation in mills throughout the world, the GRADEX Chip Classifier is ideal for controlling chip quality.

PC-CONTROL The GRADEX software is Windows® based and provides the greatest operational flexibility. It can be set up in the test lab or any other environment where a standard PC can be used.

More than ten years of in-use experience has demonstrated that GRADEX 2000 provides consistent, reliable performance with extremely low maintenance. When maintenance is required, all components are easily accessed and serviced. A typical cycle for a single sample is as follows:

Configuration
Operator selects pre-set test configuration and enters sample information.
Operator loads samples
Tests are ready to run and will require no more operator time. System loads sample into classification drum. Drum is arranged with up to 6 decks to provide required size and/or thickness separation.
Separation
Drum begins reciprocating motion to perform the first thickness and/or size classification. Material passes through the deck, is weighed and recorded in database. Drum automatically rotates to next largest deck and process is repeated and proceeds for all sides of drum.
Record Generation
Simple classification is completed, results are saved to database – can be sent to mill central computer system and printed automatically.

COMPUTER CONTROL CABINET The standard GRADEX control system is housed in a free-standing console, complete with dual fans that keep your machine dust free. The console serves as an operator work station, housing the PC keyboard, monitor and printer.

ON-LINE CONTROL Sampling and classification cycle is automated and requires no operator interface. Remote PC is connected for data collection and software maintenance. Can be configured to perform either random or scheduled tests of in-stream material.